1997
DOI: 10.1002/bbpc.19971011117
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Synthesis and structural characterisation of Si and SiOx particles of nanometer sizes

Abstract: The possibilities of various gas phase processes for fabrication of nanosized Si and SiOx particles have been explored in a comparative Study. Conventional and high resolution electron microscopy was used to investigate in detail agglomeration, size, shape, crystallinity, surface roughness and internal structure of the particles, respectively. Accretions of nearly spherical crystalline Si particles of 2‐8 nm size mostly embedded in amorphous matrix were prepared by means of a gas evaporation cluster source. Th… Show more

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Cited by 5 publications
(3 citation statements)
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“…Different from other observations at Si-based particulates [8][9][10][11] no particle agglomeration was found which may be due to the rapid transfer of particles from the reaction zone into high vacuum, directly after formation. This 'dilution' procedure obviously prevents the formation of larger aggregates in the cluster beam.…”
Section: Discussioncontrasting
confidence: 54%
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“…Different from other observations at Si-based particulates [8][9][10][11] no particle agglomeration was found which may be due to the rapid transfer of particles from the reaction zone into high vacuum, directly after formation. This 'dilution' procedure obviously prevents the formation of larger aggregates in the cluster beam.…”
Section: Discussioncontrasting
confidence: 54%
“…Remarkably, they do not agglomerate into larger aggregates as it is known from other routes of synthesis [8][9][10][11]. Instead, the deposits consist of separated particles, covering at random the substrates used for collection and being stacked onto each other upon prolonged deposition.…”
Section: Resultsmentioning
confidence: 98%
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