Synthesis growth and optical properties of semi organic non linear optical single crystal

Bouchouit, K.; Kouissa, B.; Migalska‐Zalas, A.; Brihi, N.; Sahraoui, B.

doi:10.1007/s11082-013-9711-3

Cited by 3 publications

(1 citation statement)

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The impressive physico-chemical properties of semiorganic nonlinear materials have drawn the attention of many researchers due to their wide range of applications in laser systems, laser alignment, microelectronics, second harmonic generation (SHG), image processing, data storage, fiber optic communication, optical switching, photonics, and electro-optic modulations [1][2][3][4]. The frontier research has been focused on the growth of organometallic compounds, as they offer high stability, large nonlinearity, low angular sensitivity, and good mechanical hardness [5,6].…”

Section: Introductionmentioning

confidence: 99%

Optical, thermal and electrical properties of pure and doped bis-thiourea cadmium formate (BTCF) crystal

Shejwal

Shkir²,

Hussaini³

et al. 2014

Phys. Scr.

View full text Add to dashboard Cite

A glycine doped bis-thiourea cadmium formate (BTCF) crystal has been grown by a slow solution evaporation technique. The shifts in vibrational frequencies of different functional groups of BTCF were identified by Fourier transform infrared (FT-IR) spectral analysis. UVvisible studies were employed to assess the optical transparency of pure and doped BTCF crystals. The optical band gap of doped BTCF is found to be 5.16 eV. The optical constants, refractive index, reflectance, and optical conductivity have been evaluated, using the transmission data. The dielectric characteristics of pure and doped BTCF were investigated by employing dielectric studies. The decomposition temperature of pure and doped BTCF crystals was determined by using thermogravimetric analysis. The encouraging third-order nonlinear optical properties of pure and doped BTCF crystals were examined by employing the Z-scan technique at 632.8 nm.

show abstract