2010
DOI: 10.1016/j.jeurceramsoc.2010.01.009
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Synthesis of carbon-rich hafnia thin films by pulsed laser deposition

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Cited by 11 publications
(10 citation statements)
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“…However, t ‐HfO 2 nanocrystallines were observed in the oxidation scale after cooling to room temperature in the present work. The stabilization mechanism of t ‐HfO 2 at room temperature might be similar to that of t ‐ZrO 2 25–30 . Both thermodynamic conditions (composition, temperature, and pressure) and kinetic conditions (activation energy of the phase change Δ G * ) have great effects on the phase stability.…”
Section: Discussionmentioning
confidence: 95%
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“…However, t ‐HfO 2 nanocrystallines were observed in the oxidation scale after cooling to room temperature in the present work. The stabilization mechanism of t ‐HfO 2 at room temperature might be similar to that of t ‐ZrO 2 25–30 . Both thermodynamic conditions (composition, temperature, and pressure) and kinetic conditions (activation energy of the phase change Δ G * ) have great effects on the phase stability.…”
Section: Discussionmentioning
confidence: 95%
“…It has been reported that undersized trivalent Al 3+ cations can be incorporated into ZrO 2 , which can partially stabilize t ‐ZrO 2 25 . Previous studies also have shown that free carbon might be a factor in stabilizing t ‐ZrO 2 26,27 . In the case of HfO 2 , the Al 3+ as well as remaining free carbon may play a similar role in the stabilization of the tetragonal phase.…”
Section: Discussionmentioning
confidence: 99%
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“…This procedure helps in offering high resistance to pullout which results in higher strength material with delayed fracture [190]. Similarly, Pejaković et al (2010) reported the synthesis of carbon rich-hafnia thin films using PLD technique. The NMR results showed that the sample contained graphene aromatically bonded carbon atoms presumably in graphene phase [191].…”
Section: Ceramic Reinforced Graphene Nanocomposites and Theirmentioning
confidence: 98%
“…4). Combined NRA and RBS analysis was already utilized to determine the composition of several light element including some TiO and HfO based materials, but these works are restricted to the case of thin films [34,35] and were mostly performed using exclusively RBS [36,37]. Moreover, none or very little is discussed about uncertainties.…”
Section: Chemical Analysis By Iga and Ibamentioning
confidence: 99%