2009
DOI: 10.1016/j.carbon.2009.03.051
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Synthesis of graphene on silicon carbide substrates at low temperature

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Cited by 165 publications
(105 citation statements)
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“…1(c) was lead to the changed of shapes and different densities of the samples [7]. Figure 1(d) display hexagonal shapes since the graphene layers were formed after precipitation of the carbon [8]. Corresponding to Gutierrez et al, similar shape variations have been reported for the CVD graphene grown on copper [7].…”
Section: Methodssupporting
confidence: 64%
“…1(c) was lead to the changed of shapes and different densities of the samples [7]. Figure 1(d) display hexagonal shapes since the graphene layers were formed after precipitation of the carbon [8]. Corresponding to Gutierrez et al, similar shape variations have been reported for the CVD graphene grown on copper [7].…”
Section: Methodssupporting
confidence: 64%
“…Ru is observed to react with 6H-SiC, and is found at 2300 x 10 15 at./cm 2 from the surface (Fig.6) after annealing at 1000 o C. Raman analysis of the thin film sample (Fig. 7) shows the formation of graphite as indicated by a typical carbon D peak at 1354 cm -1 and G peak at 1589 cm -1 [12,13,14,15,16,17] . The intensity ratio of the D and G peak are used to approximate the size of the crystalline graphite or degree of disorder of the graphite .…”
Section: Resultsmentioning
confidence: 96%
“…The intensity ratio of the D and G peak are used to approximate the size of the crystalline graphite or degree of disorder of the graphite . The D band is generally thought to be an indication of disordered or defective hexagonal planar graphite structures [12]. The G band originates from the stretching vibrations in the basal plane of ideal graphite, and a combination of D and G bands is generally regarded as an indication of polycrystalline graphitic structures [13].…”
Section: Resultsmentioning
confidence: 99%
“…Very promising is the synthesis of graphene on SiC substrates at a relatively low temperature [7] based on the carbon segregation from a metal layer saturated by carbon. This technique utilizes a Ni/SiC structure.…”
Section: Introductionmentioning
confidence: 99%