2014
DOI: 10.1016/j.jallcom.2014.07.090
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Synthesis of high Al content Al Ga1−N ternary films by pulsed laser co-ablation of GaAs and Al targets assisted by nitrogen plasma

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Cited by 2 publications
(4 citation statements)
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“…The Al composition in Al x Ga 1Àx N can also be adjusted by varying the laser fluence on the Al target. 20 The Al compositions in Al x Ga 1Àx N films B, C, and D were thus determined to be 0.11, 0.29 and 0.52, respectively, consistent with the EDXS results. It also seems that the incorporation of Al results in the degradation of the crystal structure, as suggested by the reduction in the diffraction intensity and the broadening in the diffraction width.…”
Section: Morphology and Compositionsupporting
confidence: 77%
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“…The Al composition in Al x Ga 1Àx N can also be adjusted by varying the laser fluence on the Al target. 20 The Al compositions in Al x Ga 1Àx N films B, C, and D were thus determined to be 0.11, 0.29 and 0.52, respectively, consistent with the EDXS results. It also seems that the incorporation of Al results in the degradation of the crystal structure, as suggested by the reduction in the diffraction intensity and the broadening in the diffraction width.…”
Section: Morphology and Compositionsupporting
confidence: 77%
“…The equipment and the method used for sample preparation have been described previously, 20 except that the two laser beams were delivered using two frequency-doubled Q-switched Nd:YAG lasers which were controlled separately in the present work. In the environment of nitrogen plasma generated by ECR microwave discharge of pure (99.999%) N 2 gas using a 2.45 GHz microwave, a polycrystalline GaAs target and a metallic Al target were ablated simultaneously using two focused laser beams (wavelength: 532 nm; pulse width: 5 ns).…”
Section: Sample Preparationmentioning
confidence: 99%
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