2007
DOI: 10.1143/jjap.46.1825
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Ta/Mo Stack Dual Metal Gate Technology Applicable to Gate-First Processes

Abstract: A set of constraints is derived for the operating characteristics of tokamak power reactors which are bulk-heated by electron cyclotron resonance heating (ECRH). Four heating modes are considered: ordinarywave heating at the electron cyclotron frequency, £2, and at the second-harmonic frequency, 2£2, and extraordinary-wave heating at J2 and at 2£2. For ordinary-wave heating at J2, which appears to be the most promising method, the wave frequency w « J2 must exceed the plasma frequency, co p , for wave penetrat… Show more

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Cited by 4 publications
(1 citation statement)
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“…We have previously reported that annealing at 800 C or higher temperatures decreases the EWF of Mo on SiO 2 . 9) We consider that the EWF decrease for the Mo-gate MOSFET caused by the RTA makes the EWF deviation from the midgap level comparable to that for the Ta/Mogate MOSFET and therefore, almost symmetrical V th values for the Ta/Mo-gate n-MOSFET and Mo-gate pMOSFET are obtained for the case of our experiment on the MOSFETs with the 4-nm-thick gate oxide.…”
Section: Mosfet Characterizationmentioning
confidence: 63%
“…We have previously reported that annealing at 800 C or higher temperatures decreases the EWF of Mo on SiO 2 . 9) We consider that the EWF decrease for the Mo-gate MOSFET caused by the RTA makes the EWF deviation from the midgap level comparable to that for the Ta/Mogate MOSFET and therefore, almost symmetrical V th values for the Ta/Mo-gate n-MOSFET and Mo-gate pMOSFET are obtained for the case of our experiment on the MOSFETs with the 4-nm-thick gate oxide.…”
Section: Mosfet Characterizationmentioning
confidence: 63%