Tables of Spectral Lines

Zaidel’, A. N.; Prokof’ev, V. K.; Raiskii, S. M.; Slavnyi, V. A.; Shreider, E. Ya.

doi:10.1007/978-1-4757-1601-6

Cited by 191 publications

(70 citation statements)

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“…Spectral lines are listed for atomic nitrogen at these wavelengths. [34][35][36] There are allowed atomic NI transitions in the 627.5-632.2 nm range and 670.6-674.1 nm range. There is also a N II transition in the 713.9-725.7 nm range.…”

Section: Resultsmentioning

confidence: 48%

Characterization of a-C:H:N deposition from CH4/N2 rf plasmas using optical emission spectroscopy

Clay

Speakman

Amaratunga

et al. 1996

Journal of Applied Physics

147

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Optical emission spectra ͑OES͒ from CH 4 /N 2 rf plasmas, which are used for the deposition of nitrogen-containing hydrogenated amorphous carbon ͑a-C:H:N͒ thin films, have been characterized. Previously unidentified spectral lines have been assigned to atomic N. Further identified species include CH, H, H 2 , N 2 , N 2 ϩ , N, and CN. Variations between spectra from the pure CH 4 or N 2 plasmas and the mixed CH 4 /N 2 plasma are discussed. The enhancement of excited nitrogen species, with the addition CH 4 , is attributed to Penning ionization. The observed OES variations of the CH 4 /N 2 plasma with power, pressure, and CH 4 /N 2 ratio are explained in terms of possible reaction mechanisms and their activation, and correlated with preliminary film growth characteristics.

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Section: Resultsmentioning

confidence: 48%

Characterization of a-C:H:N deposition from CH4/N2 rf plasmas using optical emission spectroscopy

Clay

Speakman

Amaratunga

et al. 1996

Journal of Applied Physics

147

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“…The strongest detected lines occur at the wavelengths listed in Table I. Also listed in Table I are lines for some atomic transitions for lithium and helium, 18 which appear to correlate with the measurements. Although fluorine has emission lines in the visible spectrum, most of our measured emission lines do not match the literature values.…”

Section: Time-resolved Spectral Measurementssupporting

confidence: 42%

“…Although fluorine has emission lines in the visible spectrum, most of our measured emission lines do not match the literature values. 18 Fluorine does have an electronic transition at 671 nm, but the relative intensity of this line is very low. The 671 nm transition in lithium is one of the strongest lines in its spectrum; therefore, the 671 nm line is more likely from lithium emission than from fluorine emission.…”

Section: Time-resolved Spectral Measurementsmentioning

confidence: 42%

Luminescence from edge fracture in shocked lithium fluoride crystals

Turley

Stevens

Capelle

et al. 2013

Journal of Applied Physics

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Light emitted from a [100] lithium fluoride crystal was characterized under shock wave compression to 28 GPa followed by complete stress release at the edges. The light was examined using time-gated optical spectrometry and imaging, time-resolved optical emission measurements, and hydrodynamic modeling. The shock arrival at the circumference of the crystal was delayed relative to the center so that the two regions could be studied at different times. The majority of the light emission originated when the shock waves released at the circumference of the crystal. Unlike previously reported results for shocked lithium fluoride, we found that the light spectrum is not strictly broad band, but has spectral lines associated with atomic lithium in addition to a broad band background. Also, the emission spectrum depends strongly on the gas surrounding the sample. Based on our observations, the line emission appears to be related to fracture of the lithium fluoride crystal from the shock wave releasing at the edges. Experimenters frequently utilize lithium fluoride crystals as transparent windows for observing shock compressed samples. Because of the experimental geometries used, the shock wave in such cases often reaches the circumference of the window at nearly the same moment as when it reaches the center of the sample-window interface. Light generated at the circumference could contaminate the measurement at the interface when this light scatters into the observed region. This background light may be reduced or avoided using experimental geometries which delay the arrival of the shock wave at the edges of the crystal.

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“…All these lines are due to N I. 12 The 821.6 nm line, due to the transition 3p 4 P -> 3s 4 we see that the emission intensity I is proportional to background pressure p(N 2 ) and cathode current J to the first power. The peak intensity includes only a small contribution from energetic neutral particles because of their large Doppler-shift.…”

Section: Resultsmentioning

confidence: 45%

“…These two spectral features are not due to sputtered W atoms, according to the spectral line tables. 12 For the Al cathode, the deconvolved spectrum in Fig. 10 shows very little light between -0.2 and -1.2 Å.…”

Section: B N Atom Energy Distributionmentioning

confidence: 46%

Nitrogen atom energy distributions in a hollow-cathode planar sputtering magnetron

et al. 2000

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Energy distributions of N atoms in a hollow-cathode planar sputtering magnetron were obtained by use of optical emission spectroscopy. A characteristic line, N I 8216.3 Å, well-separated from molecular nitrogen emission bands, was identified. Jansson's nonlinear spectral deconvolution method, refined by minimization of χ w 2 , was used to obtain the optimal deconvolved spectra. These showed nitrogen atom energies from 1 eV to beyond 500 eV. Based on comparisons with VFTRIM results, we propose that the energetic N atoms are generated from N 2 + ions after these ions are accelerated through the sheath and dissociatively reflect from the cathode.

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Tables of Spectral Lines

Cited by 191 publications

References 0 publications

Characterization of a-C:H:N deposition from CH4/N2 rf plasmas using optical emission spectroscopy

Characterization of a-C:H:N deposition from CH4/N2 rf plasmas using optical emission spectroscopy

Luminescence from edge fracture in shocked lithium fluoride crystals

Nitrogen atom energy distributions in a hollow-cathode planar sputtering magnetron

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