2020
DOI: 10.1109/tthz.2019.2952248
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TCAD Model for TeraFET Detectors Operating in a Large Dynamic Range

Abstract: We present technology computer-aided design (TCAD) models for AlGaAs/InGaAs and AlGaN/GaN and silicon TeraFETs, plasmonic field effect transistors (FETs), for terahertz (THz) detection validated over a wide dynamic range. The modeling results are in good agreement with the experimental data for the AlGaAs/InGaAs heterostructure FETs (HFETs) and, to the low end of the dynamic range, with the analytical theory of the TeraFET detectors. The models incorporate the response saturation effect at high intensities of … Show more

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Cited by 12 publications
(17 citation statements)
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“…The transient simulation results with and without modulation are in good agreement, and the results with modulation deviate from the quadratic response (proportional to V 2 a ) due to the nonideal voltagecontrolled switches in Figure 3b. This is consistent with the results of the Al-Ga-As-In-Ga-As HFET in [22]. Also, the HB simulation results agree with the transient simulation results without modulation, which validates the HB approach for THz response simulation in Sentaurus.…”
Section: Response Simulation Approachsupporting
confidence: 88%
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“…The transient simulation results with and without modulation are in good agreement, and the results with modulation deviate from the quadratic response (proportional to V 2 a ) due to the nonideal voltagecontrolled switches in Figure 3b. This is consistent with the results of the Al-Ga-As-In-Ga-As HFET in [22]. Also, the HB simulation results agree with the transient simulation results without modulation, which validates the HB approach for THz response simulation in Sentaurus.…”
Section: Response Simulation Approachsupporting
confidence: 88%
“…This suggests an efficient simulation approach for the Si-Ge HBT response, which is to use HB simulations in the low and intermediate V a ranges and transient simulation without modulation in the high V a range. The results also show the quadratic response at the low and medium intensity range and the response saturation at the high intensity range for the Si-Ge HBT, which is consistent with the V a dependence of the response for the TeraFET detectors [22].…”
Section: Response Simulation Approachsupporting
confidence: 84%
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