TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection

Zunarelli, Laura; Balestra, Luigi; Reggiani, Susanna; Sankaralingam, Raj; Dissegna, Mariano; Boselli, Gianluca

doi:10.1109/irps48203.2023.10118271

2023 IEEE International Reliability Physics Symposium (IRPS) 2023

DOI: 10.1109/irps48203.2023.10118271

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TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection

Laura Zunarelli

Luigi Balestra

Susanna Reggiani

et al.

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TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection

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