2018
DOI: 10.3390/coatings8120467
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TEM Microstructural Evolution and Formation Mechanism of Reaction Layer for 22MnB5 Steel Hot-Dipped in Al–10% Si

Abstract: Microstructural evolution and formation mechanism of reaction layer for 22MnB5 steel hot-dipped in Al–10Si (in wt %) alloy was investigated. The microstructural identification of the reaction layer was characterized via transmission electron microscopy and electron backscatter diffraction. In addition, the formation mechanisms of the phases were discussed with vertical section (isopleth) of the (Al–Si–Fe) ternary system. The solidified Al–Si coating layer consisted of three phases of Al, Si, and τ5 (Al8Fe2Si).… Show more

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Cited by 8 publications
(11 citation statements)
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“…The irregular shape of the τ 5 /Al-Si coating interface can be explained by the solidification in the Al-Si melt [ 6 , 26 ]. These findings are in good agreement with the literature [ 4 , 6 , 18 , 20 , 26 ]. The purpose of adding Si to the hot-dipping bath is to form this ternary τ 5 inhibition layer, which impedes the further diffusion of Fe into the coating, and Al in the opposite direction, thus forming a thick layer of intermetallics, especially the Fe 2 Al 5 brittle intermetallic phase.…”
Section: Resultssupporting
confidence: 93%
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“…The irregular shape of the τ 5 /Al-Si coating interface can be explained by the solidification in the Al-Si melt [ 6 , 26 ]. These findings are in good agreement with the literature [ 4 , 6 , 18 , 20 , 26 ]. The purpose of adding Si to the hot-dipping bath is to form this ternary τ 5 inhibition layer, which impedes the further diffusion of Fe into the coating, and Al in the opposite direction, thus forming a thick layer of intermetallics, especially the Fe 2 Al 5 brittle intermetallic phase.…”
Section: Resultssupporting
confidence: 93%
“…According to the chemical composition determined by SEM-EDS ( Table 2 ), this ternary phase can be identified as Fe 2 Al 8 Si (also denoted as τ 5 ) with a hexagonal structure and the P63/mmc space group [ 18 ]. The presence of the τ 5 phase was also confirmed by XRD and micro-XRD analysis ( Figure 3 , JCPDS card no 00-020-0030).…”
Section: Resultsmentioning
confidence: 99%
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