2018
DOI: 10.3390/membranes8020026
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TEM Tomography of Pores with Application to Computational Nanoscale Flows in Nanoporous Silicon Nitride (NPN)

Abstract: Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching or suspending nanoscale-size structures for analysis. Usefully, the nanomembrane itself can be manufactured to achieve a variety of nanopore topographies. The size, shapes, and surfaces of nanopores will influence transport, fouling, sieving, and electrical behavio… Show more

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Cited by 7 publications
(2 citation statements)
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References 38 publications
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“…For approximately cylindrical pores, t eff ≈ t mem , as shown in Figure e. For hourglass-shaped pores, t eff = 1/3 t mem < t mem fit well to the measured ionic conductance of TEM-drilled SiN x pores. , The hourglass-shaped pore structure, in which t eff = 1/3 t mem < t mem , was confirmed by TEM tomography and is also consistent with measured conductance through TEM-drilled pores. , …”
Section: Resultssupporting
confidence: 77%
“…For approximately cylindrical pores, t eff ≈ t mem , as shown in Figure e. For hourglass-shaped pores, t eff = 1/3 t mem < t mem fit well to the measured ionic conductance of TEM-drilled SiN x pores. , The hourglass-shaped pore structure, in which t eff = 1/3 t mem < t mem , was confirmed by TEM tomography and is also consistent with measured conductance through TEM-drilled pores. , …”
Section: Resultssupporting
confidence: 77%
“…Merged pores are usually much longer in one of their dimensions, forming a quasi-elliptic, rather than circular, cross section. Further work on the flow through these fringe geometries was performed by Madejski et al…”
Section: Methodsmentioning
confidence: 99%