2023
DOI: 10.1063/5.0139200
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Temperature-dependent electroluminescence of stressed and unstressed InAlGaN multi-quantum well UVB LEDs

Abstract: The electroluminescence of UVB light-emitting diodes emitting at 310 nm before and after 1000 h of operation is studied in the temperature range from 20 to 340 K. Before operation, the external quantum efficiency (EQE) at 10 mA gradually increases with decreasing temperature from 0.8% at 340 K to 1.8% at 150 K and then levels off. This trend is attributed to a reduction of non-radiative recombination and finally the domination of radiative recombination at low temperatures. After 1000 h of operation, the EQE h… Show more

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Cited by 6 publications
(2 citation statements)
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“…Moreover, doping in the cladding layers indirectly influences the LEE in UV-LEDs. Specifically, owing to the lack of a thorough solution for p-type doping in Al-rich AlGaN, a thick p-GaN layer is widely adopted as a substitute [25,27,33,37,39,41,43] . Hence, the vast majority of the UV light emitted towards the p-region is absorbed, restricting the increase of LEE as well as WPE.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, doping in the cladding layers indirectly influences the LEE in UV-LEDs. Specifically, owing to the lack of a thorough solution for p-type doping in Al-rich AlGaN, a thick p-GaN layer is widely adopted as a substitute [25,27,33,37,39,41,43] . Hence, the vast majority of the UV light emitted towards the p-region is absorbed, restricting the increase of LEE as well as WPE.…”
Section: Introductionmentioning
confidence: 99%
“…While controlled defect formation has reached an excellent level of maturity in traditional semiconductors such as Si and GaAs, this is not the case in wide-bandgap semiconductors, where the concentration of deep levels is significant and still strongly impacts the performance of the devices. In fact, deep levels are responsible for several physical phenomena, including carrier trapping, which leads to parametric instability [1][2][3][4][5] and degradation of the dynamic performance [6][7][8][9]; they can act as recombination centers [10,11], thus contributing to a decrease in the internal quantum efficiency of light emitters [12][13][14][15], a decrease in the carrier lifetime [16], and limited spectral purity of optoelectronic devices [17][18][19][20]. In addition, trap states can assist tunneling processes, which have detrimental effects on the reliability of several devices, including high electron mobility transistors (HEMTs) [21][22][23] and light-emitting diodes (LEDs) [24][25][26][27], and promote leakage current [22,28].…”
Section: Introductionmentioning
confidence: 99%