2016
DOI: 10.1007/s10854-016-5536-8
|View full text |Cite
|
Sign up to set email alerts
|

Temperature effects on the structural, optical, electrical and morphological properties of the RF-sputtered Mo thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
5
1

Year Published

2018
2018
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 11 publications
(6 citation statements)
references
References 25 publications
0
5
1
Order By: Relevance
“…It is noted that surface roughness values measured using atomic force microscopy on the Mo thin film sputtered over plain glass substrates were in the range of %2-10 nm. [18,22,51,54] However, in this work surface roughness determined by the optical profilometer for Mo thin film deposited on plain substrate was slightly higher. In TFSCs bottom electrode having high surface roughness is expected to improve diffuse reflectance that is more beneficial for the light absorption in the adjacent absorber layer.…”
Section: Sem and Optical Profilometer Analyses Of Bilayer Mo Thin Fil...contrasting
confidence: 58%
See 2 more Smart Citations
“…It is noted that surface roughness values measured using atomic force microscopy on the Mo thin film sputtered over plain glass substrates were in the range of %2-10 nm. [18,22,51,54] However, in this work surface roughness determined by the optical profilometer for Mo thin film deposited on plain substrate was slightly higher. In TFSCs bottom electrode having high surface roughness is expected to improve diffuse reflectance that is more beneficial for the light absorption in the adjacent absorber layer.…”
Section: Sem and Optical Profilometer Analyses Of Bilayer Mo Thin Fil...contrasting
confidence: 58%
“…These textured glass substrates were used as substrates for the growth of Mo bilayer thin film at the optimized conditions of top layer 10 min bottom À1 layer 3 min. [18,21,46,51] The observed structural and electrical properties indicate that 10/3 min Mo bilayer thin films grown on plain and textured substrates are relatable and hence the use of textured substrates for the back electrode indicates prospects of gaining improved optical performance or more particularly the reflectance behavior.…”
Section: Optical Microscopy Imaging Of Su-8 Textured Substratesmentioning
confidence: 99%
See 1 more Smart Citation
“…Magnetron sputtering is the most commonly used method for the preparation of Mo films originating from several advantages such as low cost, easy to adjust the parameters, films can be deposited uniformly on large-sized areas [6]. A large number of studies have shown that the structures and properties of Mo films are related to the preparation process and parameters [7][8][9]. For instance, Akçay et al, [10] investigated the effects of deposition pressures and powers on the structures and photoelectric properties of Mo films prepared by radio frequency (RF) magnetron sputtering.…”
Section: Introductionmentioning
confidence: 99%
“…These make Mo a primary choice as a back-contact material, not only for the common CIGS material, but also for the industry standard for novel and selenium-free absorber layers, such as Cu 2 ZnSnS 4 (CZTS), CuSnS 3 (CTS) and SnS [6,7,8]. The properties and microstructures of Mo thin films could be controlled and adjusted to promote the functionality of solar cells in industry [9] and their morphology can be obviously changed from dense to porous, depending on the processing parameters, such as the sputtering pressure, sputtering power, substrate temperature, annealing temperature, substrate-target distance and type of discharge [10,11,12,13]. These in turn affect the residual stress, conductivity, optical reflectance and adhesion with soda-lime glass (SLG) [14].…”
Section: Introductionmentioning
confidence: 99%