2011
DOI: 10.1103/physrevb.84.054109
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Temperature-induced evolution of subsurface nanocavities in argon-implanted copper

Abstract: The evolution of argon-filled nanocavities in a copper crystal under annealing is studied experimentally and theoretically. The subsurface argon-filled nanocavities are formed after a short annealing at a temperature ∼1000 K by coalescence of subsurface defects initially created by argon implantation. The further prolonged annealing at a temperature above 1075 K leads to decomposition of the nanocavities and diffusion of implanted argon out of the sample. According to a simple analysis, the mechanism of the na… Show more

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Cited by 20 publications
(21 citation statements)
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“…A more or less three-dimensional (3D) symmetric shape would be expected for an isotropic 3D growth as in the case of Ar nanoclusters formed deep below the Cu(001) [39,40] and Cu(110) [41][42][43] surfaces. However, a simple analysis reveals that this is not the case.…”
Section: A Lateral Sizementioning
confidence: 99%
“…A more or less three-dimensional (3D) symmetric shape would be expected for an isotropic 3D growth as in the case of Ar nanoclusters formed deep below the Cu(001) [39,40] and Cu(110) [41][42][43] surfaces. However, a simple analysis reveals that this is not the case.…”
Section: A Lateral Sizementioning
confidence: 99%
“…Thus, by varying U T , the topography related features such as donuts can be distinguished from the interference features. In case of Ar bubbles in Cu(0 0 1) [26], STM images showed pits that did not differ substantially between 0.3 and 1 V bias voltage. But large variation in the interference feature is reported for STM images between 1.1 and 0.27 V in an earlier work (see Fig.…”
Section: Resultsmentioning
confidence: 87%
“…Due to their limited solubility in Cu, Ar atoms are mainly trapped at vacancies. The vacancy-Ar clusters are characterized by a high binding energy (>2.87 eV) and a high migration energy (>2.55 eV), indicating that they are very stable and immobile even at high temperatures [29]. By considering all these situations, it is reasonable to assume that the main surviving defects in the as-deposited IBAD-Cu films are interstitial clusters, vacancy clusters and vacancy-Ar clusters.…”
Section: Void Formation In Ibad-cu Filmsmentioning
confidence: 98%
“…The remaining are continuously incorporated into immobile vacancy-Ar clusters and finally give rise to Ar-filled voids. Due to the strong binding energy of Ar atoms to vacancies, those voids are very stable even close to 800°C [29]. Since the formation energy and diffusion barrier for vacancies in GBs are much lower than those in the bulk [27,28], mobile vacancies have higher tendency to diffuse to GBs.…”
Section: Void Formation In Ibad-cu Filmsmentioning
confidence: 99%
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