Abstract:In the domain of re-entry materials submitted to plasma heating, the temperature reached by the samples is a prior information. In this paper, the capability of pyroreflectometry [1] to measure the true surface temperature of a C-SiC sample exposed to the high-enthalpy plasma of the Plasmatron facility [2] is assessed. This study includes general thoughts about the influence quantities on the measurement : emissivity variations during the experiment, plasma emission and windows transmission. We propose then a … Show more
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