Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysis

Wang, Shengjia; Lü, Min; Bilgeri, Laura Maria; Jakobi, Martin; Bloise, Félix Salazar; Koch, Alexander W.

doi:10.1364/oe.26.008744

Cited by 30 publications

(9 citation statements)

References 16 publications

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“…The common methods are divided into interferometric and imaging-based methods. Interferometric methods include electric speckle pattern interferometry (ESPI) [ 1 , 2 , 3 , 4 ], shear interferometry [ 5 , 6 ], and holographic interferometry [ 7 , 8 , 9 ], and these methods generally produce subwavelength accuracy. Adopting high-efficiency phase extraction methods, such as the temporal phase-shifting method [ 10 , 11 ], spatial carrier phase-shifting method [ 12 , 13 ], and Fourier transform method [ 14 , 15 ], nanometer accuracy can be achieved under laboratory conditions.…”

Section: Introductionmentioning

confidence: 99%

A New Pattern Quality Assessment Criterion and Defocusing Degree Determination of Laser Speckle Correlation Method

Sheng

Yan

et al. 2021

Sensors

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The laser speckle correlation method has found widespread application for obtaining information from vibrating objects. However, the resolution and accuracy of the laser speckle correlation method as they relate to the defocusing degree have not been analyzed sufficiently. Furthermore, the possible methods for speckle pattern quality assessment and enhancement have not been studied. In this study, the resolution and accuracy of the laser speckle correlation method are analyzed, and it is found that they are affected by the defocusing degree and speckle pattern quality, respectively. A new speckle pattern quality criterion combining the mean intensity gradient and frequency spectrum was proposed, called CMZ. The quality of the speckle pattern is higher when the CMZ is closer to zero. The proposed criterion was verified by simulated speckle patterns and real speckle patterns with different speckle sizes, densities, and gray contrasts. In the experimental setup stage, a suitable defocusing degree can be selected based on the resolution requirement and optimal speckle size, and other experimental parameters can be determined according to the CMZ criterion. Rotation and vibration experiments verified the effectiveness of the laser speckle correlation method and confirmed the reliability of the experiment preparation based on proposed CMZ criterion.

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Section: Introductionmentioning

confidence: 99%

A New Pattern Quality Assessment Criterion and Defocusing Degree Determination of Laser Speckle Correlation Method

Sheng

Yan

et al. 2021

Sensors

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“…Without out-of-plane sensitivity limitations, multi-sensitive techniques generally have both in-plane and out-of-plane sensitivities [14,[18][19][20][21][22], or 3D sensitivity [14,23]. Conventional in-plane-sensitive speckle interferometry generally requires two symmetric sensitivity vectors to obtain a pure in-plane sensitivity, so that the symmetric dual-beam system is commonly used for in-plane displacement or in-plane strain measurements [6,24,25]. This symmetric system can be both, in-plane-and out-of-plane-sensitive [19,26].…”

Section: Introductionmentioning

confidence: 99%

“…However, simultaneous quantitative phase retrieval for two symmetric sensitivity vectors is still challenging, especially for in-plane strain measurements. To measure dynamic in-plane displacement, several attempts have been made based on spatial-carrier phase shifting [25], different wavelengths [27], polarization [24], different coherence lengths [28], and spatial multiplexing [20]. For in-plane strain measurements, two-step symmetric measurements and temporal phase shifting have been realized [18,21,22,26,29].…”

Section: Introductionmentioning

confidence: 99%

Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements

Dong¹,

Wang²,

Lü³

et al. 2019

Opt. Express

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A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain measurements. The shearography system is capable of measuring crack-tip deformation fields quantitatively. A spatial multiplexing technique based on Fourier transform is employed for simultaneous and dynamic multi-component phase retrieval. Two slit spatial filters and a common-path shearing interferometer are used to obtain an improved phase quality for crack-tip deformation measurements. Mode-I fracture experiments under three-point bending were conducted to validate the feasibility and the capability of this method.

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“…Information on in-plane displacement is helpful in determining Young's modulus and Poisson's ratio of materials [3,4]. In-plane rotations, which can be determined by in-plane displacement, is an essential component of the geometrical metrology [5][6][7]. Under similar testing conditions, residual stress, obtained from in-plane displacements, has higher precision than that obtained from out-of-plane displacement [8].…”

Section: Introductionmentioning

confidence: 99%

Measurement of In-Plane Displacement in Two Orthogonal Directions by Digital Speckle Pattern Interferometry

et al. 2019

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The measurement of in-plane displacement in two orthogonal directions is of considerable significance for modern industries. This paper reports on a spatial carrier phase-shift digital speckle pattern interferometry (DSPI) for the simultaneous measurement of in-plane displacement in two orthogonal directions. The object is illuminated from a single direction and observed from four symmetrical directions simultaneously. One pair of the four observation directions is sensitive to in-plane displacement in one direction, and the other pair is sensitive to in-plane displacement in the perpendicular direction, resulting in the displacement in two directions being measured independently. The polarization property of light is used to avoid cross-interference between the two pairs of beams. Spatial carrier frequencies are generated by aperture misalignment, and the displacement in two directions is modulated onto the same interferogram. With a spatial carrier phase-shift technique, the displacement can be separated in the frequency domain and the phase can be evaluated from a single interferogram in real time. The capability of DSPI is described by theoretical discussions and experiments. Appl. Sci. 2019, 9, 3882 2 of 10 (DSPI) [3,12]. The sensitivity of Moiré interferometry and DSPI is higher than that of DIC, and the set-up of DSPI is simpler than that of Moiré interferometry. Because of the high sensitivity and flexibility of DSPI, it has been well-accepted in experimental mechanics, displacement and displacement measurements, and strain measurements.In DSPI, in-plane displacement is measured by evaluating the phase difference of two recorded speckle interferograms under load. The surface under the test is illuminated from two symmetrical directions with a single direction of observation [13], or is observed from two symmetrical directions with a single direction of illumination [14]. The measurement of a surface displacement in two orthogonal directions is often required for the complete characterization of displacement. In traditional DSPI, in-plane displacement is measured in the single direction, depending on the illumination or observation direction. For example, if the surface is illuminated from two symmetrical directions, the measured displacement is in the vector direction, which is the subtraction of the vector directions of the two illumination beams. To measure the displacement in the perpendicular direction, the illumination beams must be rotated 90 degrees around the viewing axis. To make a system sensitive to displacement in two orthogonal directions, two pairs of beams, with different directions, should sequentially illuminate the surface. Thus, two separate interferograms can be recorded and combined vectorially [1,3,8,15]. To avoid cross-interference between the two pairs of beams, they should not illuminate the surface at the same time. Sequential measurement takes more time than usual, making the simultaneous measurement of transient or non-repeatable events, that require displacement in two orth...

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Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysis

Cited by 30 publications

References 16 publications

A New Pattern Quality Assessment Criterion and Defocusing Degree Determination of Laser Speckle Correlation Method

A New Pattern Quality Assessment Criterion and Defocusing Degree Determination of Laser Speckle Correlation Method

Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements

Measurement of In-Plane Displacement in Two Orthogonal Directions by Digital Speckle Pattern Interferometry

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