The mechanisms responsible for terahertz stimulated
radiation under resonant intracenter excitation of shallow donors
in bulk germanium are considered to be the inversion laser
mechanism (ILM) and electron stimulated Raman scattering
(e-SRS). The e-SRS cross-section was estimated in the case of
resonant excitation of odd levels of a shallow arsenic donor in
germanium. The output intensity under resonant excitation of
germanium doped with arsenic is calculated. It is shown that
at an intensity exceeding the threshold for e-SRS, there should be
a competition of mechanisms leading to a decrease in the intensity
of ILM, which can be detected by the dependence of the output
intensity on time.