Dependability in Electronic Systems 2010
DOI: 10.1007/978-1-4419-6715-2_2
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Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques

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Cited by 5 publications
(6 citation statements)
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“…The number for the items corresponds to the timing shown with the underlining in Figure 4. 1. After the cold start finishes normally, the initial system status in which the cdata, pdata 1 and pdata 2 are correct, and both pdata 1 and pdata 2 are valid.…”
Section: Resilience Strategymentioning
confidence: 99%
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“…The number for the items corresponds to the timing shown with the underlining in Figure 4. 1. After the cold start finishes normally, the initial system status in which the cdata, pdata 1 and pdata 2 are correct, and both pdata 1 and pdata 2 are valid.…”
Section: Resilience Strategymentioning
confidence: 99%
“…If a Micro Processor Unit (MPU) receives an external electric signal as noise, the system function will freeze or malfunction easily [1]. Therefore, a resilience strategy for the MPU in a non-human environment is needed so that the embedded system can continue working [2].…”
Section: Introductionmentioning
confidence: 99%
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“…Static segments were designed using a time-division multiple-access (TDMA) mechanism, and are accessed by time-triggering for safety-critical systems such as drive-by-wire, adaptive cruise control (ACC), and antilock braking systems (ABS) [ 4 , 5 ]. However, radiation, crosstalk, electromagnetic interference (EMI) and power supply noise in the environment cause a lot of interference for the vehicle network [ 6 ]. If a transient fault occurs, it will result in transmission delay, data loss, and a miscalculation in logic, which is very dangerous during driving.…”
Section: Introductionmentioning
confidence: 99%
“…Another concern is that a static random-access memory (SRAM)-based FPGA is vulnerable to soft errors caused by a single-event upset (SEU) regarding radiation of cosmic rays [17]. Particularly, neutrons are recognized as a major cause of soft errors for microelectronics on ground.…”
mentioning
confidence: 99%