Test methodology of a new upset mechanism induced by protons in deep sub-micron devices

Weulersse, C.; Miller, F.; Alexandrescu, Dan; Schaefer, Erwin; Crépel, Olivier; Gaillard, R.

doi:10.1016/j.microrel.2012.06.076

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2020

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“…The ensuing concern is whether the direct ionization mechanism of LEPs will substantially increase the total on-orbit SEU rate (OOSR). Based on this consideration, researchers have conducted a series of investigations on LEP-induced SEUs for different types of devices and in various research perspectives [2][3][4][5][6][7][8][9][10][11], and the contribution of LEPs to the total OOSR also became a hot research area [2,3,6,[12][13][14].…”

Section: Introductionmentioning

confidence: 99%

Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Liu³

et al. 2020

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The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.

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Section: Introductionmentioning

confidence: 99%

Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Liu³

et al. 2020

Symmetry

View full text Add to dashboard Cite

show abstract

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices

Cited by 1 publication

References 10 publications

Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

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