“…Generally, high test-retest reliability is reported for TEOAEs (Harris et al, 1991;Vedantam & Musiek, 1991;Franklin et al, 1992;Engdahl et al, 1994;Marshall & Heller, 1996;Dieler et al, 1999) as well as for DPOAEs (Franklin et al, 1992;Roede et al, 1993;Zhao & Stephens, 1999;Shehata-Dieler et al, 1999;Beattie & Bleech, 2000;Beattie et al, 2003;Hallenbeck & Dancer, 2003;Ng & McPherson, 2005;Mills et al, 2007;Sockalingam et al, 2007;Wagner et al, 2008). Test-retest measurements without probe-replacement has the smallest amount of variability which is indicative for the intrinsic variability of emission amplitudes, while a larger variability is determined after probe-refi tting.…”