Testing the configurable analog blocks of field programmable analog arrays

Abstract

The problem of testing the Configurable Analog Blocks (CABs) of Field Programmable Analog Arrays (FPAAs) is addressed in this paper. The considered fault model comprises deviations in the nominal values of CAB programmable capacitors, deviations in the programmable gains of CAB input amplifiers and stuckon/stuck-open faults in CAB switches. The problem of test stimuli generation is solved, in a first approach, by using the Oscillation Test Strategy (OTS), which is associated to a test response analysis external to the device under test. In a second approach, a Built-In Self-Test (BIST) scheme is proposed by associating to the OTS an Output Response Analyzer (ORA) built using the internal FPAA resources. Both approaches are validated using the ispPAC10 FPAA from the Lattice Semiconductor Corporation. In the paper, the approaches are compared in terms of fault coverage, test application time and required external hardware resources for testing. Experimental results show that a good compromise of these aspects can be found by taking the best of each approach.

A low-cost configurability test strategy for an embedded analog circuit

“…The first efforts for applying known test techniques to the area of Field Programmable Analog Arrays (FPAAs) were made by Balen et al [5][6][7]. In [5], the authors apply the oscillation-based test concept for testing configurable blocks of the ispPAC10 device from Lattice s .…”

“…In [6], they propose a test response analyzer configured in the device and evaluated its fault detection ability through fault injection in the capacitors of the CUT. Finally, the same authors check in [7] the ability of the proposed analyzer for detecting faults injected in switches and input amplifiers.…”

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

“…However, the test of EACCs has been comparatively less explored. The first efforts for applying well-known test techniques to field programmable analog arrays (FPAAs) are reported in [6][7][8]. The authors apply oscillation-based test (OBT) for testing the configurable blocks of the ispPAC10 device from lattice and propose a test response analyzer configured in the device, evaluating its fault detection ability through fault injection in the capacitors, switches, and input amplifiers.…”