Testing the IBM Power 7&amp;#x2122; 4 GHz eight core microprocessor

Crafts, J. M.; Bogdan, David R.; Conti, D.R.; Forlenza, D.; Forlenza, Orazio; Huott, W.; Kusko, M.P.; Seymour, Edward; Taylor, T.M.; Walsh, B.

doi:10.1109/test.2010.5699204

Cited by 3 publications

(2 citation statements)

References 8 publications

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“…Industrial experiences, such as [10] and [11], have confirmed the suitability of the methodology. In [4] an interesting case targeting a multicore processor is presented. In that experience functional patterns are loaded in cache and applied to each of the 8 Processing Units belonging to a 4 GHz multicore server in order to perform partial-good device binning.…”

Section: Sbst For On-line Testingmentioning

confidence: 99%

On-line software-based self-test of the Address Calculation Unit in RISC processors

Bernardi

Ciganda

Carvalho

et al. 2012

2012 17th Ieee European Test Symposium (Ets)

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Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs with the mission application. This paper proposes a method for the generation of SBST programs to test on-line the Address Calculation Unit of embedded RISC processors, which is one of the most heavily impacted by the online constraints. The proposed strategy achieves high stuck-at fault coverage on both a MIPS-like processor and an industrial 32-bit pipelined processor; these two case studies show the effectiveness of the technique and the low effort.

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Section: Sbst For On-line Testingmentioning

confidence: 99%

On-line software-based self-test of the Address Calculation Unit in RISC processors

Bernardi

Ciganda

Carvalho

et al. 2012

2012 17th Ieee European Test Symposium (Ets)

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“…For example, one degree centigrade increasing, the positive voltage drop will decrease with number 2mV. This is called negative temperature coefficient [2]. This is the basic theory for IC's temperature measurement.…”

Section: Introductionmentioning

confidence: 99%

Thermal sensor and test technology improving for automotive ICS

Zong

Xiao

Zhu³

2014

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

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Analog ICs are widely used in automotive, industrial and consumer area. ICs working environment such as the temperature is the major fact which affect the performance of ICs. The top lead semiconductor companies all on research for developing integrated temperature sensor inside their ICs. This article investigates the method of thermal sensor structure and the test technology improving on automatic test equipment. The high accuracy testing method and system configuration are presented on Intelligent Distribution Controller (IDC) IC. The experiment result shows this method has higher accurate to measure the real chip temperature than the traditional method (achieve ±2°C tolerance). The flash array is using for storing the temperature calibration data.

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