2019
DOI: 10.1088/2053-1591/ab23be
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The ability of GexGa4S96-xchalcogenide glasses dissolving rare earth probed by x-ray photoelectron spectra analysis

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Cited by 3 publications
(3 citation statements)
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“…There is only one Ga ion in each independent unit, and the valence state of Ga is investigated by X-ray photoelectron spectroscopy (XPS) analysis. The binding energies at 1116.7 eV (2p 3/2 ) and 1143.3 eV (2p 1/2 ) indicate that Ga is trivalent in this structure (Figure S1). In a minimal independent unit, tetra-coordinated Ga 3+ forms a tetrahedral structure with oxygen, which pertains to four ligands.…”
Section: Resultsmentioning
confidence: 97%
“…There is only one Ga ion in each independent unit, and the valence state of Ga is investigated by X-ray photoelectron spectroscopy (XPS) analysis. The binding energies at 1116.7 eV (2p 3/2 ) and 1143.3 eV (2p 1/2 ) indicate that Ga is trivalent in this structure (Figure S1). In a minimal independent unit, tetra-coordinated Ga 3+ forms a tetrahedral structure with oxygen, which pertains to four ligands.…”
Section: Resultsmentioning
confidence: 97%
“…Similarly, demixed structural units could be GeS 4/2 and GaS 3/2 , where these threshold behaviors of physical properties in GeGaS glasses can be traced to "demixing" of networks above the chemical thresholds. This has been demonstrated by structural investigations of GeGaS glasses via analyzing their Raman and X-ray photoelectron spectra [15,27]. Obviously, excellent network connectivity implies less homopolar bonds, and thus large amount of heteropolar bonds with strong chemical bonding energy in the glass, leading to a maximum value of hardness and laser damage threshold.…”
Section: Resultsmentioning
confidence: 99%
“…Ge/Ga -S-Ge/Ga Ge、Ga 和 S 原子的电负性分别是 2.01、1.81 和 2.58 [34] 。根据以往的研究结 果,S 原子主要表现为 2 配位。由于过配位原子和欠配位原子的数目相对较少, 因此,我们忽略 Ge 原子和 Ga 原子的电负性差异,将 S 2p 光谱分解为三个不同 的最近邻构型, 随着结合能减小依次分别对应 S-S-S、 S-S-Ge/Ga 和 Ge/Ga-S-Ge/Ga, 如图 2 所示。 在 Ge 24 Ga 8 S 68 中存在两个结合能较高的结构单元, 分别归属于 S-S-S 结构单元(163.1 eV 附近)和 S-S-Ge/Ga 结构单元(162.2 eV 附近) [12,35] 。随着 Ge 含量的逐渐增加,较高结合能的 S-S-S 结构单元和 S-S-Ge/Ga 结构单元的积 分面积比值逐渐减少,并最终分别消失于 Ge 26.67 Ga 8 S 65.33 和 Ge 32 Ga 8 S 60 玻璃结 构中;然而,对于结合能相对较低的 Ge/Ga-S-Ge/Ga 结构单元(位于 161.6 eV 附近)则随着 Ge 含量的增加而增加 [12,35] ;当 Ge 含量增加到 32%时,玻璃结构…”
Section: S-s-s S-s-ge/gaunclassified