1988
DOI: 10.1116/1.575449
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The Au/Si(111)7×7 interface: Correlation between electronic and morphological properties by high-resolution electron energy-loss spectroscopy, ultraviolet photoemission spectroscopy, and transmission electron microscopy

Abstract: We have studied the diffusive Au/Si(111)-7×7 interface by surface sensitive techniques (high-resolution electron energy-loss and ultraviolet photoemission spectroscopies) and by transmission electron microscopy (TEM). The combination of the spectroscopic methods with TEM allows us to propose a new morphological description of the layer growing at room temperature, namely, that there are crystallites of pure Au embedded in an amorphous AuxSi1−x alloy matrix.

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Cited by 15 publications
(4 citation statements)
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“…This result suggests that position C is very close to the surface of the silicon substrate. It is known that a very thin silicide (Au−Si alloy) layer is formed when a gold film is grown on silicon. , Thus, the surface sites indicated by C in Figure is believed to possess a different chemical nature from the top surface of the Au film. We speculate that pores within the Au films are adsorption sites for CO L (s) rather than the top surfaces of metal particles (A and B).…”
Section: Resultsmentioning
confidence: 99%
“…This result suggests that position C is very close to the surface of the silicon substrate. It is known that a very thin silicide (Au−Si alloy) layer is formed when a gold film is grown on silicon. , Thus, the surface sites indicated by C in Figure is believed to possess a different chemical nature from the top surface of the Au film. We speculate that pores within the Au films are adsorption sites for CO L (s) rather than the top surfaces of metal particles (A and B).…”
Section: Resultsmentioning
confidence: 99%
“…4,18,19,22,24 However, the building of the Fermi energy step at ϳ0.33 ML of Au, attributed to early alloy formation, can be due to gold clustering. 23 Recent high-resolution EELS and UPS experiments also indicate the presence of pure Au clusters in the first few Au-Si layers, 20 in opposition to STM results 27 which reported a layer-by-layer growth.…”
Section: Introductionmentioning
confidence: 95%
“…In spite of the many different surface techniques which have been used to study thin Au films on Si at RT, due to the difficulty of obtaining a direct correlation between electronic and morphological properties of the system there is little agreement over the exact nature of the interface. A nonexhaustive list of the techniques used, individually or combined, includes low-energy electron diffraction ͑LEED͒, [1][2][3][4][5][6][7][8][9] Auger electron spectroscopy ͑AES͒, [2][3][4][6][7][8][10][11][12][13] MeV ion backscattering, [14][15][16][17] electron-energy-loss spectroscopy ͑EELS͒, 4,6,[8][9][10][11][12][13][14][15][16][17][18][19][20] x-ray photoelectron spectroscopy ͑XPS͒, 21 ultraviolet photoelectron spectroscopy ͑UPS͒, 20,[22][23][24][25] photoemission yield spectroscopy, 7 soft-x-ray photoelectron spectroscopy,…”
Section: Introductionmentioning
confidence: 99%
“…Beside these reports there have been a number of others published over last decades in which attempts to determine the crystallographic and electronic structures and morphology of the Au layers grown on Si have been undertaken [33][34][35][36][37][38][39][40][41][42][43][44][45][46][47]. Among most important findings are: (i) the formation of gold silicide (AuSi) at the top of Au layer, (ii) a sharp interface between Au and Si [40], and (iii) the existence of Au crystallites with different epitaxial relationship with respect to the Si substrate [46].…”
Section: Introductionmentioning
confidence: 97%