Proceedings of the 33rd Annual Conference on Design Automation Conference - DAC '96 1996
DOI: 10.1145/240518.240598
|View full text |Cite
|
Sign up to set email alerts
|

The automatic generation of functional test vectors for Rambus designs

Abstract: We present a method for the automatic generation of test vectors for functional verification, giving the advantages of random and directed testing. We show the use of a formal specification as input to a test generator. We present techniques for the efficient implementation of the generator. We discuss our experience with this method applied to commercial designs. We show how our approach is a stepping stone towards practical formal verification.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1998
1998
1999
1999

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…Design-specific coverage analysis and test generation approaches have been proposed for processors (e.g., [1], [11], [12]). …”
Section: B Hdl Coverage Analysismentioning
confidence: 99%
“…Design-specific coverage analysis and test generation approaches have been proposed for processors (e.g., [1], [11], [12]). …”
Section: B Hdl Coverage Analysismentioning
confidence: 99%