2020
DOI: 10.17531/ein.2020.2.19
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The concept of integrating vapor chamber into a housing of electronic devices for increased thermal reliability

Abstract: Article citation info: (*) Tekst artykułu w polskiej wersji językowej dostępny w elektronicznym wydaniu kwartalnika na stronie www.ein.org.pl KorTA J, SKruch P. The concept of integrating vapor chamber into a housing of electronic devices for increased thermal reliability.

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