The contribution to the non-uniform distribution of motion effects obtained for the SC-cut quartz plates

Mateescu, I.; Zelenka, J.

doi:10.1109/freq.1996.559888

Cited by 6 publications

(2 citation statements)

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“…Based on the previous studies and on Steven and Tiersten's analysis of the trapped-energy SC-cut resonators [7], Zelenka [8] has performed the theoretical computation of the effective mass-loading, effective coupling coefficient and dynamic capacitance of the trapped-energy resonators for coupled thickness-shear and thickness-twist modes.…”

Section: Introductionmentioning

confidence: 99%

“…A comparison between theoretical and experimental results on SC-cut resonator [8] with various electrode diameters and thickness was performed. The conclusion is that at low frequencies, thin electrodes and large electrode diameter, the non-uniform distribution of motion is done by the coupling of the thickness-shear with thickness-twist modes, while for higher frequencies, thick electrodes and small electrode diameter it is done by the stress related effects at electrode-substrate interface.…”

Section: Introductionmentioning

confidence: 99%

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Investigations on the langasite resonators by X-ray topography

Mateescu¹,

Capelle²,

Détaint³

et al.

IEEE International Frequency Control Sympposium and PDA Exhibition Jointly With the 17th European Frequency and Time Forum, 200

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In this paper the results of electrical measurements of the mass-loading influence on Y-cut langasite resonator parameters are compared with those obtained by X-ray topography analysis of the same resonators. Based on the Ballato's transmission-line analogs of the trapped-energy resonators vibrating in thickness-shear mode [1], the massloading effect on resonator characteristics was studied. The effective mass-loading, motional inductance and quality factor of langasite resonators were computed.Sawyer plan-parallel polished Y-cut langasite resonators with 14mm diameter, 5 MHz resonant frequency, Au electrodes of 7 mm diameters and various thickness were used in experiments.X-ray topography measurements were performed by conventional transmission Laue setting using the white beam synchrotron radiation on fundamental, third and fifth overtones. The results are in agreement with those obtained by electrical measurements.The comparison of X-ray diffraction topography images previously performed on AT-cut quartz resonators with X-ray topographs on langasite resonators pointed out that the Y-cut langasite resonators are less influenced by the mass-loading than the AT-cut quartz resonators.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%