“…As shown in Figure 5 , there is a broad peak at 2θ = 20°−25°, in all XRD patterns that is attributed to the characteristic diffraction peak of amorphous carbon [ 45 ]. For the patterns of samples were carbonized at 650 and 800°C, i.e., Pd–Zn-ins/CNS-650, Pd–Zn-ins/CNS-800, the diffraction peaks, located at 2θ = 26.8°, 30.8°, 41.2°, 44.1°, 55.2°, 64.2°, 72.9 and 79.2° correspond to the lattice planes of (001), (110), (111), (200), (002), (112), (310) and (311) of PdZn, respectively [ 34 , 35 , 36 , 37 , 38 , 39 , 40 , 41 ]. No diffraction peaks of individual palladium and zinc or their oxides were detected.…”