For the vast majority of applications that involve medium-to-high-voltage operation, partial discharge (PD) has been a chronic issue that causes accelerated dielectric material aging and device failure. Nowadays, with the increasing power density of various medium-to-high-voltage applications, the dielectric challenges introduced by PD are increasing. However, the elimination of PD has been considered virtually impossible due to manufacturing defects that are unavoidable. In this paper, we introduce an entirely new approach that utilizes electrets as a solution to the dielectric challenges caused by PD. Here, we theoretically show that the incorporation of electret layers substantially reduces the undesired high electric fields that promote PD activities. The results suggest that high electric field around sharp edges, triple points, airgaps, and bubbles can be reduced substantially either by controlling the distance between an electret layer and a high-field surface or by tailoring the surface charge density of the electret layers. The required distance and surface charge density for electric field mitigation are theoretically derived and confirmed by finite element analysis. We demonstrate the validity of the proposed method by applying it to laminated structures, in which triple points, airgaps, and bubbles exist. We also report practical considerations and limitations associated to the proposed use of electrets as a solution to PD. The long-term goal of the research is providing enhanced resiliency to the emerging technologies that involve higher electric field and higher power density. INDEX TERMS Electric stress, partial discharge, laminated busbars, power electronic modules, electret, sharp edges, triple point, airgap, bubble, dielectric material aging, device failure, high field, high power density.