2020
DOI: 10.1016/j.radphyschem.2020.108750
|View full text |Cite
|
Sign up to set email alerts
|

The current status of time-resolved XAS beamline at SLRI and application on in situ experiments

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(1 citation statement)
references
References 34 publications
0
1
0
Order By: Relevance
“…The in situ XAS was further performed to study the influence of CH 4 and temperature on the ZnO film. The prepared film was cut into a circular shape with an outer diameter of 5 mm and then inserted into the test reactor [19]. The Zn K-edge XANES were collected during thermal treatment under 5% v/v CH 4 /N 2 at 400 • C with a heating rate of 5 • C/min.…”
Section: Sensor Characterizationmentioning
confidence: 99%
“…The in situ XAS was further performed to study the influence of CH 4 and temperature on the ZnO film. The prepared film was cut into a circular shape with an outer diameter of 5 mm and then inserted into the test reactor [19]. The Zn K-edge XANES were collected during thermal treatment under 5% v/v CH 4 /N 2 at 400 • C with a heating rate of 5 • C/min.…”
Section: Sensor Characterizationmentioning
confidence: 99%