2003
DOI: 10.1063/1.1570948
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The deformation-DIA: A new apparatus for high temperature triaxial deformation to pressures up to 15 GPa

Abstract: A fast real time measurement system to track in and out of plane optical retardation/ birefringence, true stress, and true strain during biaxial stretching of polymer films Rev.

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Cited by 271 publications
(160 citation statements)
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“…Quantitative measurement of deviatoric stress in the DAC remains a challenging task, partly because pressure generation and uniaxial stress are coupled in the DAC. A device called "deformation-DIA" has been developed [209,554], which allows independent control of the differential stress and deformation strain under a certain confining pressure. Alternatively, a rotational Drickamer apparatus has been used for additional torsion through anvil rotation under a confining pressure [555].…”
Section: Plasticitymentioning
confidence: 99%
See 1 more Smart Citation
“…Quantitative measurement of deviatoric stress in the DAC remains a challenging task, partly because pressure generation and uniaxial stress are coupled in the DAC. A device called "deformation-DIA" has been developed [209,554], which allows independent control of the differential stress and deformation strain under a certain confining pressure. Alternatively, a rotational Drickamer apparatus has been used for additional torsion through anvil rotation under a confining pressure [555].…”
Section: Plasticitymentioning
confidence: 99%
“…In specially designed multianvil devices such as the deformation DIA [209,210] or rotational Drickamer apparatus [211], R-XRD is used to measure stresses in a sample under a controlled differential stress field during deformation. Strains can be measured using radiography, consequently permitting measurements of the stress-strain curves of bulk samples at HP [212,213].…”
Section: Hp Radial Xrdmentioning
confidence: 99%
“…Specimens were deformed in between two alumina pistons, in compression along their axis, at P and T reaching respectively 8.5 GPa and 1673 K, in the D-DIA (Wang et al, 2003) that equipped the X17-B2 beam line of the National Synchrotron Light Source (upton, NY, USA). We used boron-epoxy or mullite cubic pressure media and, to compress the cells, tungsten carbide anvils opaque to the x rays and transparent cBN or sintered diamond anvils.…”
Section: Deformation Experimentsmentioning
confidence: 99%
“…This was achieved by carrying out deformation experiments on San Carlos olivine single crystals at mantle P and T, in a Deformation DIA apparatus (D-DIA) coupled with synchrotron radiation (Wang et al, 2003).…”
Section: Introductionmentioning
confidence: 99%
“…There are multiple avenues one might take to study plastic deformation under simultaneous high pressure, high temperature while probing the sample using in situ x-ray diffraction: ͑a͒ in a large volume press ͑LVP͒ such a Drickamer 13 or the multianvil device, 14 ͑b͒ in a DAC that is heated internally with a laser, 15 and ͑c͒ in a DAC that is heated externally through a resistive heater such as graphite. Each of these techniques has its advantages and disadvantages.…”
Section: Introductionmentioning
confidence: 99%