The development of an inspection system for indium tin oxide circuits

Abstract

In this study, an inspection system for indium tin oxide (ITO) circuits has been developed. In the developed system, a polymer dispersed liquid crystal (PDLC)/ITO film is used as a sensing device to locate faulty shut/open circuits. The examined object and the PDLC/ITO film are both linked to an external power source to form an electric field. With the power on, the crystals line up, re-orientate themselves and the film covering the conducting area turns clear while the liquid crystals covering the non-conducting area are randomly scattered and diffuse light in all directions. The voltage range of the power source required to change the state of the PDLC film was estimated theoretically. Simulations were conducted to study the effects of the external power on the performance of the developed system. The results were then verified experimentally. It was shown that the developed system is a feasible system for ITO circuit inspection.

Real-Time Automatic Defect Inspection of PCTP ITO Circuits Using a 1-D Image Comparison Algorithm

“…Chan et. al., presented an electrical inspection system for ITO circuits [5]. In the system, a polymer dispersed liquid crystal (PDLC) film is used as a sensing device to locate faulty circuits.…”