The development of correct methods for Sn–Pb solder analysis by wavelength dispersion X-ray fluorescence spectrometry

2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

“…Gorewoda et al 226 improved the sample preparation method for the analysis of tin-lead solder by WDXRF spectrometry, to overcome the problem of smearing and to obtain the smallest and most reproducible microstructures. Gorewoda et al 226 improved the sample preparation method for the analysis of tin-lead solder by WDXRF spectrometry, to overcome the problem of smearing and to obtain the smallest and most reproducible microstructures.…”

Novel sample treatment procedures for the determination of phosphorus in Cu‐based alloys using X‐ray fluorescence spectrometry to solve the microstructural effect issue

“…In the analysis of real samples (delivered by solder producers), the phosphorous concentration results often had unacceptable levels of error compared to the reference value, which was obtained using the classical volumetric method. Our previous studies on the analysis of soft solders showed that microstructural effects can be the source of such errors . Microstructural effects occur when the size of the microstructure has an impact on the intensity of the registered fluorescence radiation.…”

“…Under certain conditions, remelting may be beneficial for material characteristics. For example, in SnPb alloys, rapid cooling resulted in the creation of small microstructures . However, the remelting of hard solders requires temperatures greater than 1,000 °C.…”

“…Our previous studies on the analysis of soft solders showed that microstructural effects can be the source of such errors. [4] Microstructural effects occur when the size of the microstructure has an impact on the intensity of the registered fluorescence radiation. To obtain better averages and more accurate representatives of the analyzed sample volume, the size of the microstructure should be a fraction of the elemental information depth (d I ).…”

Determination of tungsten in tantalum–tungsten alloy by X-ray fluorescence spectrometry using fusion, thin layer, and pressed powder pellet techniques

“…However, although these techniques have their own advantages, they suffer from limitation of being rather time-consuming (gravimetry) or poor accuracy due to the dilution of the sample (spectrophotometry, AAS, ICP-OES, and ICP-MS). To overcome the above analytical difficulties, XRF spectrometry can be considered as a potent tool, for it is especially applicable to the fast and accurate analysis of high and medium content elements and has been wildly used in the field of metallurgy [11][12][13], geology [14,15],environment [16][17][18], drug [19], food [20], and so on. Based on its advantages, an XRF method is tried here to determine tungsten in Ta-W alloy.…”