2014
DOI: 10.1063/1.4894265
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The effect of metal-contacts on carbon nanotube for high frequency interconnects and devices

Abstract: Articles you may be interested inTuning of the electro-mechanical behavior of the cellular carbon nanotube structures with nanoparticle dispersions Appl. Phys. Lett. Contact resistance between metal and carbon nanotube interconnects: Effect of work function and wettability Appl. Phys. Lett. 95, 264103 (2009); 10.1063/1.3255016 Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes Rev. Sci. Instrum. 74, 3653 (2003);High frequency characterisati… Show more

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Cited by 4 publications
(1 citation statement)
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“…17 S-parameter measurements were done using an Agilent Precision Network Analyser (PNA) E8361C at room and low temperatures under vacuum (10 À5 millibar) for more details and instrument calibration see references. 17,18 The temperature dependent I-V measurements were done using the Agilent B1500A semiconductor analyser with a 1 pA resolution. Measurement parasitic (i.e., effects due to the substrate) were extracted by using the open-short de-embedding method an industrially accepted technique, see the Eq.…”
mentioning
confidence: 99%
“…17 S-parameter measurements were done using an Agilent Precision Network Analyser (PNA) E8361C at room and low temperatures under vacuum (10 À5 millibar) for more details and instrument calibration see references. 17,18 The temperature dependent I-V measurements were done using the Agilent B1500A semiconductor analyser with a 1 pA resolution. Measurement parasitic (i.e., effects due to the substrate) were extracted by using the open-short de-embedding method an industrially accepted technique, see the Eq.…”
mentioning
confidence: 99%