2005
DOI: 10.1134/1.1992633
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The effect of neutron irradiation on the properties of n-InSb whisker microcrystals

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Cited by 15 publications
(10 citation statements)
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“…The closest experiment to that presented in this article was carried out using the WWR-2 reactor (fluence 7.4 × 10 17 , the temperature during the irradiation of 110 °C). The conclusions presented in [48] are consistent with ours in terms of both the magnitude of the signal drop after irradiation and the estimated optimal input carrier concentration value.…”
Section: Discussion Of Different Sensor Platformssupporting
confidence: 89%
“…The closest experiment to that presented in this article was carried out using the WWR-2 reactor (fluence 7.4 × 10 17 , the temperature during the irradiation of 110 °C). The conclusions presented in [48] are consistent with ours in terms of both the magnitude of the signal drop after irradiation and the estimated optimal input carrier concentration value.…”
Section: Discussion Of Different Sensor Platformssupporting
confidence: 89%
“…Before 2003, a technique to grow InSb whisker microcrystal free crystallization from a gaseous phase [ 45 ] with the initial iodine pressure of 375 Torr heated source up to 760 °C is already pioneered; at growth temperature, the carrier gases can react in the growth chamber with the precursors that can be doped with several impurities simultaneously (Sn, Al, and Cr) during their growth [ 46 ]. This kind of addition of impurity as metal droplet acts as seed to start the synthesis of NWs also observed in the conventional CVD.…”
Section: Reviewmentioning
confidence: 99%
“…The magnetic measuring instrumentation (MMI) discussed herein employs Hall sensors based on III-V semiconductor materials InSb and InAs with high mobility of charge carriers as primary magnetic field transducers. A significant amount of studies dedicated to increase in radiation resistance of these materials has been carried out in order to create radiation resistant sensors [4,5]. These studies have shown that irradiation of indium containing semiconductors with neutrons causes the generation of fast neutron induced radiation defects of donor and acceptor nature in such materials.…”
Section: Radiation Resistant Magnetic Field Hall Sensorsmentioning
confidence: 99%
“…Therefore, these materials would require separate approaches to their parameters stabilization at such conditions. The radiation stability of the InSb parameters is achieved through a balance between acceptor type radiation defects and donors generated due to transmutation of indium [4]. Similar stabilization of the irradiated InAs material is possible at the optimum concentration corresponding to the Fermi level pinning in the conduction band [6].…”
Section: Radiation Resistant Magnetic Field Hall Sensorsmentioning
confidence: 99%
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