The synchrotron x-ray absorption near edge structures (XANES) technique was used in conjunction with first-principles calculations to characterize Al-doped ZnO films. Standard characterizations revealed that the amount of carrier concentration and mobility depend on the growth conditions, i.e. H 2 ðor O 2 Þ=Ar gas ratio and Al concentration. First-principles calculations showed that Al energetically prefers to substitute on the Zn site, forming a donor Al Zn , over being an interstitial (Al i ). The measured Al K-edge XANES spectra are in good agreement with the simulated spectra of Al Zn , indicating that the majority of Al atoms are substituting for Zn. The reduction in carrier concentration or mobility in some samples can be attributed to the Al Zn -V Zn and 2Al Zn -V Zn complex formations that have similar XANES features. In addition, XANES of some samples showed additional features that are the indication of some -Al 2 O 3 or nAl Zn -O i formation, explaining their poorer conductivity.