2017
DOI: 10.1016/j.surfcoat.2017.01.062
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The effects of microstructure on optical and thermal properties of porous silica films

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Cited by 5 publications
(3 citation statements)
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“…[42] According to Fresnel's reflection principle, the relationship between reflectance (R) and the refractive index (n) of a homogeneous thin film coated on a substrate can be described by Formula (1). [43,44]…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…[42] According to Fresnel's reflection principle, the relationship between reflectance (R) and the refractive index (n) of a homogeneous thin film coated on a substrate can be described by Formula (1). [43,44]…”
Section: Resultsmentioning
confidence: 99%
“…[ 42 ] According to Fresnel's reflection principle, the relationship between reflectance ( R ) and the refractive index (n) of a homogeneous thin film coated on a substrate can be described by Formula (). [ 43,44 ] R=[n0nnormalsn2n0nnormals+n2]2$$\text{R = [} \frac{\text{n0ns�?n2}}{\text{n0ns+n2}} \left(\text{]}\right)^{2}$$where n 0 , n s, and n represent the refractive indices of air, substrate, and thin film coated on the substrate, respectively. Considering that the refractive indices at 632.8 nm of air and the quartz glass are 1 and 1.46, respectively, the optimal refractive index of the coating for reducing surface reflection should be close to 1.21.…”
Section: Resultsmentioning
confidence: 99%
“…The mirror confinement magnetic field was applied in order to enhance the plasma density. A negatively biased glassy carbon target is known to attract Ar + ions to sputter carbon species towards the substrate [25]. The substrate was a single-sided polished 4-inch N-type conductive silicon wafer (square resistance of ~10 Ω, 0.5 mm thickness).…”
Section: Experimental Methodsmentioning
confidence: 99%