2009
DOI: 10.1016/j.jpcs.2009.05.004
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The effects of porous silicon on the crystalline properties of ZnO thin films

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Cited by 63 publications
(18 citation statements)
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“…Our ZnO films, obtained at a relatively "soft" temperature for synthesis conditions (300°C), have a low value of residual stress and high crystalline perfection even without subsequent annealing. The comparison of our results with the results of other authors, for example [14,17], allows us to conclude that the low value of the residual stress is caused by the effect of a porous silicon substrate.…”
Section: Samplesupporting
confidence: 75%
“…Our ZnO films, obtained at a relatively "soft" temperature for synthesis conditions (300°C), have a low value of residual stress and high crystalline perfection even without subsequent annealing. The comparison of our results with the results of other authors, for example [14,17], allows us to conclude that the low value of the residual stress is caused by the effect of a porous silicon substrate.…”
Section: Samplesupporting
confidence: 75%
“…Different approaches have been followed to deposit ZnO on PS or nucleate it inside PS such as pulsed laser deposition 1 , magnetron sputtering 3,4 , thermal spray 22 or sol-gel spin-coating [23][24][25] . Relevantly, the sol-gel technique has been described to produce proper nanocomposites with adjustable optoelectronic properties since low surface tension ZnO precursors are able to easily permeate the PS with precise Zn 2+ concentrations 26 .…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, the rough surface morphology of the PS substrate plays a major role in controlling the growth of the wetting layer. The porous layer is a good substrate in lattice mismatch heteroepitaxy due to its special surface morphology [18]. The surface of the porous silicon layer is composed of numerous nano-silicon crystals.…”
Section: Resultsmentioning
confidence: 99%