2008
DOI: 10.1109/tns.2008.2007120
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The Effects of Proton Irradiation on the Performance of High-Voltage n-MOSFETs Implemented in a Low-Voltage SiGe BiCMOS Platform

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Cited by 6 publications
(2 citation statements)
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“…Once mirrored into the output branches, the differential signal is converted to a voltage by diodes M 13 and M 14 , where it is read by standard low-voltage CMOS analog processing circuitry. The pMOS transistors forming the high-side current sources are protected from breakdown by high-voltage N-wells as described by Najafizadeh et al [9]. The low-voltage current source is formed by LDMOS transistors available in-process, also as described by Najafizadeh et al [9].…”
Section: High-voltage Levelmentioning
confidence: 99%
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“…Once mirrored into the output branches, the differential signal is converted to a voltage by diodes M 13 and M 14 , where it is read by standard low-voltage CMOS analog processing circuitry. The pMOS transistors forming the high-side current sources are protected from breakdown by high-voltage N-wells as described by Najafizadeh et al [9]. The low-voltage current source is formed by LDMOS transistors available in-process, also as described by Najafizadeh et al [9].…”
Section: High-voltage Levelmentioning
confidence: 99%
“…The pMOS transistors forming the high-side current sources are protected from breakdown by high-voltage N-wells as described by Najafizadeh et al [9]. The low-voltage current source is formed by LDMOS transistors available in-process, also as described by Najafizadeh et al [9].…”
Section: High-voltage Levelmentioning
confidence: 99%