2008 European Conference on Radiation and Its Effects on Components and Systems 2008
DOI: 10.1109/radecs.2008.5944064
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The effects of proton irradiation on coolrunner-II - CPID technology

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Cited by 7 publications
(3 citation statements)
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“…In 2007, during the feasibility phases of the OPTOS program, a series of irradiation test campaigns were conducted [29] with the aim of characterizing the SEE sensibility of the CoolRunner-II devices to high-energy proton particles. Six CPLDs were tested (DUT 1 to DUT 6), four of them (DUT 1, DUT 7, DUT 2, and DUT 3) were in static mode to study SEU susceptibility, DUT 1 and DUT 7 irradiated while powered on to test SRAM memory, and finally DUT 2 and DUT 3 also powered on and off, respectively, to test flash configuration memory in different conditions.…”
Section: Experimental Irradiation Testmentioning
confidence: 99%
“…In 2007, during the feasibility phases of the OPTOS program, a series of irradiation test campaigns were conducted [29] with the aim of characterizing the SEE sensibility of the CoolRunner-II devices to high-energy proton particles. Six CPLDs were tested (DUT 1 to DUT 6), four of them (DUT 1, DUT 7, DUT 2, and DUT 3) were in static mode to study SEU susceptibility, DUT 1 and DUT 7 irradiated while powered on to test SRAM memory, and finally DUT 2 and DUT 3 also powered on and off, respectively, to test flash configuration memory in different conditions.…”
Section: Experimental Irradiation Testmentioning
confidence: 99%
“…T be carefully analyzed, especially if the SR technology (which is particularly prone to tra is chosen and the final application will b unfriendly environment. [9].…”
Section: A the Lin Standardmentioning
confidence: 99%
“…This is one of the cheapest and most effective techniques in relation with area overhead and fault tolerance achieved. In the next subsection a comparison of the implementation of this technique with previous work presented in [9] is detailed. The FSM has eight reachable states: by coding them with a One-hot method, 5 extra FFs are required, introducing a negligible overhead in the combinational area (7%).…”
Section: ) Error Detection Mechanisms Addedmentioning
confidence: 99%