“…However, pH-ISFET devices based on Si 3 N 4 sensing membrane normally show unstable properties on threshold voltage stemming from the conversion of silicon nitride film to a hydrated silicon dioxide (SiO 2 ) or an oxynitride layer during the contact with an aqueous solution (Jamasb et al, 1998a,b). In order to solve this problem, several high dielectric constant (high-k) materials, including Al 2 O 3 , Ta 2 O 5 , ZrO 2 , HfO 2 , Y 2 O 3 , Gd 2 O 3 and Pr 2 O 3 were recently proposed as a pH sensing membrane borrowing from their good sensing performance and highly thermal stability, as demonstrated in the literature (Bousse et al, 1990;Kwon et al, 1996;Yoshida et al, 2004;Lai et al, 2006;Liao, 2007, 2008;Chang et al, 2006). Nevertheless, the poor interface existing in between the metal oxide and Si substrate (Wilk et al, 2001) remains a technical hurdle to overcome.…”