2012
DOI: 10.1016/j.jnoncrysol.2011.09.021
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The electrical switching and thermal behavior of bulk Ge15Te85−xSnx and Ge17Te83−xSnx glasses

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Cited by 8 publications
(2 citation statements)
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“…The transition pressure P T is seen to decrease with increasing Sn concentration in the series of samples studied. Electrical switching as well as thermal stability [27] and other studies on this series of samples indicate that Sn (tin) atoms do not interact with the host matrix but form a phase separated network of their own and remain as inclusions in the parent matrix. Consequently, there is no enhancement of network connectivity and rigidity and this is reected in the decrease in switching voltages with the addition of tin rather than an increase.…”
Section: Discussionmentioning
confidence: 64%
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“…The transition pressure P T is seen to decrease with increasing Sn concentration in the series of samples studied. Electrical switching as well as thermal stability [27] and other studies on this series of samples indicate that Sn (tin) atoms do not interact with the host matrix but form a phase separated network of their own and remain as inclusions in the parent matrix. Consequently, there is no enhancement of network connectivity and rigidity and this is reected in the decrease in switching voltages with the addition of tin rather than an increase.…”
Section: Discussionmentioning
confidence: 64%
“…the switching is reversible. The GeTeSn samples undergo memory type of switching [27] which indicates that amorphous to crystalline phase transition takes place easily in these samples. However, the semiconductor to near metallic transition observed under the application of pressure seems to be reversible with its origins in the reduction of the energy bandgap rather than a structural phase change.…”
Section: Discussionmentioning
confidence: 99%