The Field Emitter: Fabrication, Electron Microscopy, and Electric Field Calculations

Dyke, W. P.; Trolan, J. K.; Dolan, W. W.; Barnes, G.A.

doi:10.1063/1.1721330

Cited by 219 publications

(47 citation statements)

References 11 publications

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“…Solving Eq. (26) requires that the intersection of the LHS and the RHS be found as a function of apex temperature T e for a given base temperature T o . An example is shown for the case T o 600 K in Fig.…”

Section: Analysis and Discussionmentioning

confidence: 99%

“…Surface migration of atoms or clusters of atoms (''protrusions'' in the parlance of Charbonnier) becomes possible when temperature and field conditions favor it: considerable literature has been devoted to the theoretical study and experimental characterization of it and its relation to electron emission [26]. Ancona [27] in particular argues, in his study of metal field emitter failure, that his findings suggest melting accompanies tip failure rather than triggers it.…”

Section: Localized Heating Due To Emission and Its Relation To Brmentioning

confidence: 99%

See 1 more Smart Citation

Electron emission contributions to dark current and its relation to microscopic field enhancement and heating in accelerator structures

Jensen

Lau

Feldman

et al. 2008

Phys. Rev. ST Accel. Beams

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Analytically tractable models of thermal-field emission, field enhancement, and heating mechanisms (Nottingham and resistive) are developed and combined to make estimates of the fields and temperatures that accompany the development and growth of asperities. The relation of asperity dimensions to dark current is discussed in two experimentally motivated examples. The hypothetical relation of microscopic sources of dark current and heating to breakdown is discussed in the context of Nottingham and resistive heating. The latter are estimated using a general thermal-field methodology. A point-charge model is used to find field enhancement factors. Last, a thermal model is used to estimate the temperature dependence of the resistivity and thermal conductivity. Together, these models suggest that conditions can arise in which the temperature at the apex of an asperity can experience growth and contribute to melting or fracture (or both), and that Nottingham heating generally dominates the resistive heating term.

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Section: Analysis and Discussionmentioning

confidence: 99%

Section: Localized Heating Due To Emission and Its Relation To Brmentioning

confidence: 99%

Electron emission contributions to dark current and its relation to microscopic field enhancement and heating in accelerator structures

Jensen

Lau

Feldman

et al. 2008

Phys. Rev. ST Accel. Beams

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“…The etching process produces a conical shape to the wire below the surface of the solution. The cone shortens as the etching proceeds; in general, longer cones have sharper ends than shorter cones, 28 and etching at a faster rate produces sharper tips than etching at slower rates. FI tips made by electrochemical etching did not have any observable limit to shelf life.…”

Section: A Fi Tip Preparationmentioning

confidence: 99%

“…[26][27][28][29][30] We chose to electrochemically etch 200 micron W wire in a 0.5 M solution of NaOH using a few volts 60 Hz ac. The sharpness of the tip depends on concentration, length of wire, time in solution, and current.…”

Section: A Fi Tip Preparationmentioning

confidence: 99%

Current-voltage relation for a field ionizing He beam detector

DePonte

Elliott

Kevan

2009

Journal of Applied Physics

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Emerging interest in utilizing the transverse coherence properties of thermal energy atomic and molecular beams motivates the development of ionization detectors with near unit detection efficiency and adequate spatial resolution to resolve interference fringes of submicron dimension. We demonstrate that a field ionization tip coupled to a charged particle detector meets these requirements. We have systematically studied the current-voltage relationship for field ionization of helium using tungsten tips in diffuse gas and in a supersonic helium beam. For all 16 tips used in this study, the dependence of ion current on voltage for tips of fixed radius was found to differ from that for tips held at constant surface electric field. A scaling analysis is presented to explain this difference. Ion current increased on average to the 2.8 power of voltage for a tip at fixed field and approximately fifth power of voltage for fixed radius for a liquid nitrogen cooled tip in room temperature helium gas. For the helium beam, ion current increased as 2.2 power of voltage with constant surface field. The capture region of the tips was found to be up to 0.1 m 2 for diffuse gas and 0.02 m 2 in the beam. Velocity dependence and orientation of tip to beam were also studied.

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“…However, this symbol β is also used for the conversion of the voltage to the local field as introduced by Dyke et al [121]:…”

Section: Distance Dependence Of Field Enhancement For Non-planar Fielmentioning

confidence: 99%

Field emission sensing for non-contact probe recording

Febre¹

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Cover:In the micro scanning probe array memory (µSPAM) concept, magnetic probes are used to write and read on a patterned recording medium. A single probe consists of a sharp tip on a flexible cantilever, that is used to detect the small magnetic forces from its bending. By maintaining a constant current of electrons, field emitted from the probe tip to the conducting medium, the distance between the tip apex and the patterned sample can be controlled, also when scanning over the medium surface. For experimental demonstration of this method, we used a scanning probe microscope mounted inside an ultra-high vacuum system, which is depicted on the back cover. FIELD EMISSION SENSING FOR NON-CONTACT PROBE RECORDING AbstractIn probe recording an array of thousands of nanometer-sharp probes is used to write and read on a storage medium. By using micro-electromechanical system technology (MEMS) for fabrication, small form factor memories with high data density and low power consumption can be obtained. Such a system is expected to offer a promising route towards extremely high-density recording, with bits of several nanometer or even atomic size. To reach these densities, individual control over the position of the probes is essential, to be able to operate the probes in non-contact as is for instance done in scanning tunneling microscopy (STM).At the MESA + Institute for Nanotechnology at the University of Twente, we currently investigate the possibilities of probe recording using a magnetic medium. In the micro scanning probe array memory (µSPAM) concept, an array of magnetic probes is used to write and read on a patterned recording medium. In such a probe storage system, there is also a need to position individual probes at several nanometers above the recording medium, to be able to detect the small magnetic forces. For this non-contact operation, individual z-feedback should be achieved by integration of an actuator, proximity sensor and feedback loop for each probe of the probe array. As reported in literature, the fabrication of probe arrays and integration of actuators and logic circuitry have already been proven to be attainable, however current research still lacks a proximity sensor with sufficient lateral resolution that can be integrated in each probe.The objective of this thesis is to investigate whether field-emission can be used as an integrated method to control probe-medium distance for non-contact probe recording. Field emission can be used as a proximity sensing method, since the emission current varies exponentially with the electric field, which in turn is proportional to the electrode gap. The lateral resolution is determined by the probe tip radius, on the same order as the targeted bit size of about 10 nm. The signal to noise ratio is not affected by the small sensing area, which is an important advantage over other sensing methods. Moreover it provides an elegant solution for the problem of sensor integration in each probe of the array, since only one wire per probe is needed to connect to the...

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The Field Emitter: Fabrication, Electron Microscopy, and Electric Field Calculations

Cited by 219 publications

References 11 publications

Electron emission contributions to dark current and its relation to microscopic field enhancement and heating in accelerator structures

Electron emission contributions to dark current and its relation to microscopic field enhancement and heating in accelerator structures

Current-voltage relation for a field ionizing He beam detector

Field emission sensing for non-contact probe recording

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