The formation of plane-wave X-ray images of microdefects

Abstract

A theory of the formation of X‐ray images of microdefects is developed. It is shown that at sufficiently high collimation of the incident wave it is possible not only to reveal such defects but also to obtain the images of their elastic fields almost without any additional diffraction within the Borrmann fan typical of the conventional topography. The possibility to observe displacement fields near microdefects with dimensions beyond the limits of X‐ray topography resolution is demonstrated with the aid of computer simulation of wave fields and the analytical estimates. It is shown that plane‐wave images give information on the type, dimensions, and orientation of microdefects. The effect of the incident‐wave divergence on the experimental results is also discussed.

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

“…2). On the INT map, its image is well known (Tanner, 1976;Indenbom & Kaganer, 1985;Green et al, 1990): the precipitate shows, in the low-absorption case, two lobes separated by a line of no contrast perpendicular to h, the diffraction vector. This corresponds to the effective misorientation resulting from a strain field…”

Analysis of X‐ray extinction in crystals with inhomogeniously distributed dislocations

“…However, because of the broadening of the diffraction lines caused by non-ideal optics of the instrument (instrumental broadening) the procedure doesn't yield any reasonable results applied to real crystals with dislocation densities up to (ρ d < 10 12 m -2 ) in which dynamical diffraction come into being. Due to multiple scattering the half-width at full maximum of the azimuthal intensity distribution of reflections which is an intersection of the scattering domain in the perpendicular direction of diffraction vector (FHWM) and the integrated intensity of diffraction line change and the interpretation of the diffraction lines becomes much more difficult [5][6][7]. Moreover, X -ray dynamical diffraction gives rise to extinction phenomenon -decreasing of integrated reflectivity in comparison with ones www.crt-journal.org…”

Calculated images of dislocations in crystals on section topograms

“…defect and determine the sign of the Burgers vector [1,[10][11][12]. =a/2<110> of each dislocation segment lie in the loop plane, is apparently the most probable model presentation of sliding dislocation loop [13,14].…”