1994
DOI: 10.1007/bf00756885
|View full text |Cite
|
Sign up to set email alerts
|

The Freja F3C Cold Plasma Analyzer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
14
0

Year Published

1994
1994
2017
2017

Publication Types

Select...
6
2

Relationship

3
5

Authors

Journals

citations
Cited by 29 publications
(14 citation statements)
references
References 18 publications
0
14
0
Order By: Relevance
“…The SII differs from the more common “top hat” analyzer [ Carlson et al , 1982] in that its focusing system images the energy distribution (rather than stepping through energy with time), and is optimized for lower‐energy particles [ Whalen et al , 1994; Knudsen et al , 2003]. The resulting particle flux distribution is amplified using a microchannel plate and phosphor screen, then reduced in diameter 3:1 and transferred through a 1‐m‐long coherent fiber‐optic imaging bundle.…”
Section: Mission and Instrumentationmentioning
confidence: 99%
“…The SII differs from the more common “top hat” analyzer [ Carlson et al , 1982] in that its focusing system images the energy distribution (rather than stepping through energy with time), and is optimized for lower‐energy particles [ Whalen et al , 1994; Knudsen et al , 2003]. The resulting particle flux distribution is amplified using a microchannel plate and phosphor screen, then reduced in diameter 3:1 and transferred through a 1‐m‐long coherent fiber‐optic imaging bundle.…”
Section: Mission and Instrumentationmentioning
confidence: 99%
“…As shown in Whalen et al (1994), the finite range of the ion entrance position in the aperture plane results in a small inward spread in the radial focusing (∼10 %) and a symmetric spread in the azimuth focusing (∼5°to 15°), as incident ions near the edge of the sensor are deflected to a slightly smaller radius for a given incident ion energy and azimuth. The detector pixel widths were chosen to optimize the ion energy and angular sampling range and resolution given this de-focusing, and to minimize the differences in size between pixels and the resulting potential amplifier crosstalk, while keeping the design and machining tolerance requirements to an achievable level.…”
Section: Instrument Design and Principle Of Operationmentioning
confidence: 96%
“…In contrast with the top-hat design, the hemispherical electrostatic analyzer (HEA) design (Whalen et al 1994) allows the simultaneous sampling of particles over not only the full 360°range of incident azimuth but also an extended range of energy-per-charge. A timeof-flight gate was added to this design in the thermal plasma analyzer (TPA) on Nozomi (Yau et al 1998b), giving the analyzer a capability to image the mass-resolved velocity distribution of each ion species in two dimensions (2D).…”
Section: Introductionmentioning
confidence: 99%
“…At each E / q , the solid trace denotes the ion trajectory along the center axis, and the dashed and dotted traces illustrate the negligibly small inward spread in radial focusing of “off‐axis” ions from the center axis at the entrance aperture. This inward spread is accompanied by a symmetric spread in the azimuth focusing [ Whalen et al ., ].…”
Section: Sensor Designmentioning
confidence: 99%