2014
DOI: 10.1016/j.materresbull.2014.05.040
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The growth of GaSb/Al0.33Ga0.67Sb MQW on n-Silicon (100) with Al0.66Ga0.34Sb/AlSb SPS layers

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Cited by 6 publications
(2 citation statements)
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“…This is a critical issue for electrical device applications. The authors are presently working on developing the technology to grow Sb-based materials on large-area Si substrates in line with the "More than Moore" concept [10].…”
Section: Growth Of Sb-based Epilayers On Gaas By Using Mbementioning
confidence: 99%
“…This is a critical issue for electrical device applications. The authors are presently working on developing the technology to grow Sb-based materials on large-area Si substrates in line with the "More than Moore" concept [10].…”
Section: Growth Of Sb-based Epilayers On Gaas By Using Mbementioning
confidence: 99%
“…The growth of the polar GaSb material on the non-polar Si surface and the large lattice mismatch (12.1%) between these two materials lead to significant challenges for the growth of GaSb thin films on Si substrates. [11][12][13] Additionally, a high-k dielectric is needed for GaSb-based MOS devices, and the band-offset parameters between the high-k dielectric=GaSb channel should be larger than 2 eV in order to suppress the leakage current. [14][15][16] The goal of this study is to demonstrate a high-quality GaSb epilayer grown on Si for CMOS applications.…”
mentioning
confidence: 99%