“…For CdTe, this technique is mostly used to study the often encountered electrical contact problem [8]- [10], the etching procedure effect [11]- [13], and doping effects [14], [15]. Furthermore, this procedure is also widely used in DSSC, perovskite, Cu 2 ZnSnS 4 , and silicon solar cells [16]- [23]. This technique has also been used for CIGS solar cells [24]- [28] for general defects analysis.…”