Digest of Technical Papers.1990 Symposium on VLSI Technology 1990
DOI: 10.1109/vlsit.1990.111006
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The improvement of Al-Si-Cu alloy interconnects by hafnium and boron addition

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“…It improves the intrinsic gate delay especially for multi input NAND circuits [13]. Ultra low voltage SRAM operation is achieved as well [19].…”
Section: Application To High Performance Mosfetsmentioning
confidence: 99%