2002
DOI: 10.1016/s0022-3093(01)01204-2
|View full text |Cite
|
Sign up to set email alerts
|

The influence of defects on response speed of high gain two-beam photogating in a-Si:H PIN structures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
10
0

Year Published

2013
2013
2023
2023

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(12 citation statements)
references
References 8 publications
2
10
0
Order By: Relevance
“…However, in case of dichromatic or multispectral illumination, the local low-field region might be offset so that the transport of electrons generated in the device front is facilitated. In result, a significantly larger amount of photogenerated electrons can drift towards the electrical contact so that collection efficiencies can exceed unity gain 27 , 29 , 33 . Such light-induced electrical field deformations enabled by photogating predominantly occur in defective materials, like a-Si:H, which exhibits a large amount of deep dangling bond states rather than localized tail states.…”
Section: Resultsmentioning
confidence: 99%
“…However, in case of dichromatic or multispectral illumination, the local low-field region might be offset so that the transport of electrons generated in the device front is facilitated. In result, a significantly larger amount of photogenerated electrons can drift towards the electrical contact so that collection efficiencies can exceed unity gain 27 , 29 , 33 . Such light-induced electrical field deformations enabled by photogating predominantly occur in defective materials, like a-Si:H, which exhibits a large amount of deep dangling bond states rather than localized tail states.…”
Section: Resultsmentioning
confidence: 99%
“…However, in contrast to their crystalline counterpart, the photocurrent in reverse biased a-Si:H p-i-n photodiodes can significantly exceed that expected from the generation of primary photo-induced charge carriers, if the device is photo-gated utilizing an additional gate beam [13,14].…”
Section: Introductionmentioning
confidence: 97%
“…A few years later, collection efficiency and photocurrent gain values up to almost 50 in the visible range have experimentally been demonstrated by Main et al [13] in comparatively thick photodetectors by applying high reverse bias voltages of -25 V. Unfortunately, absolute responsivities have not been reported impeding a quantitative performance comparison with the state-of-the-art. To achieve a sufficient device gating stability and such high optical gain values, extensive annealing and light-soaking prior to the measurements have been reported to be mandatory [13,14,16]. Initial degradation, e.g., by utilizing extensive AM1.0 illumination (AM: air mass coefficient), was required to generate an in-built low-field region in the front of the device that can be controlled and modulated by a weakly absorbed gate beam [13].…”
Section: Introductionmentioning
confidence: 99%
“…To estimate the DOS in the lower part of band gap between the Fermi level and valence band edge, methods such as constant photocurrent method (CPM) [21], Fourier transform photocurrent spectroscopy (FTPS) [22,23], and dual beam photoconductivity (DBP) [24] were used in the past. On the other hand, the multiexponential trapping rate and modulated photocurrent (MPC) technique [25][26][27] allow determining parameters of localized states throughout the entire energy gap by employing frequency and temperature scans.…”
Section: Introductionmentioning
confidence: 99%
“…The aim of our research is the mammalian cells chemiluminescence detection, which is based on the phenomenon that under illumination of two-beam, low intensity probe beam and simultaneously a higher intensity bias beam, reverse-biased a-Si:H p-i-n photodiode photocurrent exceed expected primary photocurrent [26].…”
Section: Introductionmentioning
confidence: 99%