The Influence of Grain Size Determination Method on Grain Growth Kinetics Analysis

Abstract

The full-width at half-maximum (FWHM), integral width (IntW), and Scherrer methodologies were used jointly with X-ray diffraction (XRD) peak broadening and transmission electron microscopy (TEM) data to provide insight into the mechanisms that govern grain growth behavior in an Al 5083-B 4 C nanocomposite. Grain growth kinetics were studied by fitting the appropriate grain size data from the three XRD-based methods to the well-known Burke equation. Variations observed in the absolute grain sizes calculated from different methods were in agreement with previous studies. In spite of these variations, consistent grain growth trends were observed, which resulted in relatively similar Arrhenius plots indicating two grain growth regimes. Consequently, the applicability as well as any relevant uncertainties within each method are described and discussed.

Tuning the Morphology and Activity of Electrospun Polystyrene/UiO-66-NH2 Metal–Organic Framework Composites to Enhance Chemical Warfare Agent Removal

“…All materials show increasing intensity with increasing MOF content. In most cases, the peaks of the composite are slightly wider than those in the parent MOF, which is likely due to reduced crystal size and to having less agglomerates in the composites in comparison to the pure MOF . Thus, UiO-66-NH 2 appears to remain intact after the electrospinning process and is present in all composites.…”

Synergistic Effects of Ultrasonic Rolling Textures and PTFE‐PPS/SiO2 Coatings on Dry Friction and Wear Properties of GCr15 Steel Surfaces

“…[ 21 ] The grain size could be calculated using the Scherrer equation (Equation ()). [ 28 ] The X‐ray source has a wavelength λ of 0.15406 nm, the Scherrer constant K is 0.89, β refers to the full width at half maximum (FWHM, radians), θ refers to the diffraction angle (radians), and D refers to the grain size (nm). The grain sizes of USRP textures were reduced according to Figure 5b.…”

“…[21] The grain size could be calculated using the Scherrer equation (Equation ( 2)). [28] D ¼ Kλ βcos θ…”

Effect of Crystallization Temperature on the Microstructures and Mechanical Properties of Enamel Substrate RT330

“…Therefore, the force that needs to be applied to move a dislocation from a larger grain is less than that from a smaller one, which cases that the materials with larger grains exhibit lower yield stress. Because the grain size increased with the increasing crystallization temperature, the strength of RT330 enamel substrate should decrease with the increasing crystallization temperature …”